PRECISE MEASUREMENTS OF HALF-LIVES OF SHORT-LIVED NUCLEI
Department of Nuclear Engineering, Nagoya University,
Furo-cho, Chikusa-ku, Nagoya 464-01, Japan
Toshiyuki Iida and Akito Takahashi
Department of Nuclear Engineering, Osaka University,
Yamadaoka, Suita-shi, Osaka 565, Japan
The half-lives of short-lived nuclei produced by 14 MeV or thermal neutron bombardments were measured with Ge detectors in the spectrum multi-scaling mode. The corrections for the pile-up loss and the dead time were performed by applying both source and pulser methods. A possible systematic uncertainty was checked changing the fitting data points. Half-lives of 13N, 18F, 24Na, 27Mg, 28Al, 37S, 38K, 42K, 52V, 62Cu, 94mNb and 116mIn were determined with relative uncertainties of 0.05 to 0.8%.
KEYWORDS: Half-life measurement, short-lived nuclei, neutron irradiation, Ge detector, spectrum multi-scaling